关键词: 小麦叶片, 叶尖识别, 叶片计数, 注意力机制, YOLOv8, 深度学习

Abstract:

[Objective] The enumeration of wheat leaves is an essential indicator for evaluating the vegetative state of wheat and predicting its yield potential. Currently, the process of wheat leaf counting in field settings is predominantly manual, characterized by being both time-consuming and labor-intensive. Despite advancements, the efficiency and accuracy of existing automated detection and counting methodologies have yet to satisfy the stringent demands of practical agricultural applications. This study aims to develop a method for the rapid quantification of wheat leaves to refine the precision of wheat leaf tip detection. [Methods] To enhance the accuracy of wheat leaf detection, firstly, an image dataset of wheat leaves across various developmental stages—seedling, tillering, and overwintering—under two distinct lighting conditions and using visible light images sourced from both mobile devices and field camera equipmen, was constructed. Considering the robust feature extraction and multi-scale feature fusion capabilities of YOLOv8 network, the foundational architecture of the proposed model was based on the YOLOv8, to which a coordinate attention mechanism has been integrated. To expedite the model's convergence, the loss functions were optimized. Furthermore, a dedicated small object detection layer was introduced to refine the recognition of wheat leaf tips, which were typically difficult for conventional models to discern due to their small size and resemblance to background elements. This deep learning network was named as YOLOv8-CSD, tailored for the recognition of small targets such as wheat leaf tips, ascertains the leaf count by detecting the number of leaf tips present within the image. A comparative analysis was conducted on the YOLOv8-CSD model in comparison with the original YOLOv8 and six other prominent network architectures, including Faster R-CNN, Mask R-CNN, YOLOv7, and SSD, within a uniform training framework, to evaluate the model's effectiveness. In parallel, the performance of both the original and YOLOv8-CSD models was assessed under challenging conditions, such as the presence of weeds, occlusions, and fluctuating lighting, to emulate complex real-world scenarios. Ultimately, the YOLOv8-CSD model was deployed for wheat leaf number detection in intricate field conditions to confirm its practical applicability and generalization potential. [Results and Discussions] The research presented a methodology that achieved a recognition precision of 91.6% and an mAP_0.5 of 85.1% for wheat leaf tips, indicative of its robust detection capabilities. This method exceled in adaptability within complex field environments, featuring an autonomous adjustment mechanism for different lighting conditions, which significantly enhanced the model's robustness. The minimal rate of missed detections in wheat seedlings' leaf counting underscored the method's suitability for wheat leaf tip recognition in intricate field scenarios, consequently elevating the precision of wheat leaf number detection. The sophisticated algorithm embedded within this model had demonstrated a heightened capacity to discern and focus on the unique features of wheat leaf tips during the detection process. This capability was essential for overcoming challenges such as small target sizes, similar background textures, and the intricacies of feature extraction. The model's consistent performance across diverse conditions, including scenarios with weeds, occlusions, and fluctuating lighting, further substantiated its robustness and its readiness for real-world application. [Conclusions] This research offers a valuable reference for accurately detecting wheat leaf numbers in intricate field conditions, as well as robust technical support for the comprehensive and high-quality assessment of wheat growth.

Key words: wheat leaves, tip detection, leaf counting, attention mechanism, YOLOv8, deep learning